HIGHLEVEL
SEE-RAD
The SEE-RAD test system brings together the proven features of our ETS780 tester (such as true APG memory test and powerful FA tools) with the newest technology of the Griffin III. With all new high-accuracy DC Parametrics, superior precision pin drivers, and capture memory of 64M, the Griffin SEE-RAD combines the newest innovations in the test industry with our years of experience in Radiation Test.
Crucial to good signals over long cables is the quality of the pin drivers for signal consistency and to reduce noise to a minimum. For noise is additive, and noise being present on the lines at the moment of exposure and observation has a likelihood that is real, even if the possibility is low. The key is a high quality driver and reliable environment. The HiLevel drivers are better than ever, delivering 50 mA of drive current in a controlled 50-Ohm environment, even being programmable to drive below 0 volts. And our internal programmable loads help with termination to keep DUT output signals clean.
Features :
- Test rates up to 100MHz (50MHz All Modes)
- True APG Memory Test
- Two strobes per cycle
- Up to 512 pins
- Real time failure counter
- Display “capture fails only” mode
- High-speed acquisition search
- Full “next cycle” operation
- 64Meg capture depth
- Programmable loads and parallel loads
- Multiple high-precision DC PMU units
- Timing On-the-Fly
